EIAJ资源列表

[国外标准] EIAJ EDR-4701B Handling Guidance for Semiconductor Devices

[国外标准] EIAJ ED-7311-21 Standard of integrated circuits package (P-HSOP)

[国外标准] EIAJ ED-7311-19 Standard of integrated circuits packages (P-SOP)

[国外标准] EIAJ ED-7311-18 Standard of integrated circuit package (P-ILGA)

[国外标准] EIAJ ED-4704 Failure mechanism driven reliability test methods for LSIs

[国外标准] EIAJ ED-4702A Mechanical strength testing methods for surface mounted semiconductor devices

[国外标准] EIAJ ED-4702

[国外标准] EIAJ ED-4701-500 Environmental and endurance test methods for semiconductor devices(Miscellaneous)

[国外标准] EIAJ ED-4701-400-1 Environmental and endurance test methods for semiconductor devices(Stress test II

[国外标准] EIAJ ED-4701-400 Environmental and endurance test methods for semiconductor devices(Stress test II)

[国外标准] EIAJ ED-4701-300-3：2006 Environmental and endurance test methods for semiconductor devices(Stress te

[国外标准] EIAJ ED-4701-300-2 Environmental and endurance test methods for semiconductor devices(Stress test I)

[国外标准] EIAJ ED-4701-300 Environmental and endurance test methods for semiconductor devices(Stress test I)

[国外标准] EIAJ ED-4701-200 Environmental and endurance test methods for semiconductor devices (Life test II)

[国外标准] EIAJ ED-4701-100 Environmental and endurance test methods for semiconductor devices(Life test I)

[国外标准] EIAJ ED-4701-001 Environmental and endurance test methods for semiconductor devices (General)