SAE J1752-3-2003 (R) Measurement of Radiated Emissions from Integrated CircuitsTEMWideband TEM (GTEM

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关键词： SAE J1752 2003 Measurement of

标准简介

SAE J1752-3-2003 (R) Measurement of Radiated Emissions from Integrated CircuitsTEMWideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)